Abstract:
This paper presents the results of pressure-effects on performance characteristics of near-infra-red perovskite light emitting diodes (PeLEDs) using a combination of experimental and analytical/computational approaches. First, pressure-effects are studied using models that consider the deformation and contacts that occur around interfacial impurities and interlayer surface roughness in PeLEDs. The predictions from the model show that the sizes of the interfacial defects decrease with increasing applied pressure. The current-voltage characteristics of the fabricated devices are also presented. These show that the PeLEDs have reduced turn-on voltages (from 2.5 V to 1.5 V) with the application of pressure. The associated pressure-induced reductions in the defect density and the bandgaps of the perovskite layer are then used to explain the improved performance characteristics of the PeLED devices.
