Please use this identifier to cite or link to this item: https://repository.rsif-paset.org/xmlui/handle/123456789/323
Title: Zero-Vuln: Using deep learning and zero-shot learning techniques to detect zero-day Android malware
Authors: Sawadogo, Zakaria
Dembele, Jean-Marie
Mendy, Gervais
Ouya, Samuel
Keywords: Zero-day malware Android detection , Deep learning , Zero-day vulnerabilities , Zero-shot learning
Issue Date: 22-Sep-2023
Publisher: IEEE Xplore
Abstract: The prevalence of cyber security threats, such as the Android Zero-day vulnerability, is becoming increasingly worrisome. With the widespread use of Android-powered mobile devices, attackers are leveraging zero-day vulnerabilities to infect Android software at an alarming rate. Detecting zero-day vulnerabilities in Android applications is particularly challenging due to their unpatched and undiscovered nature, resulting in a lack of reference points for identification. In response to this issue, we propose a novel and effective system called Zero-Vuln, which is designed to classify and identify zero-day Android malware. Zero-Vuln leverages deep learning and zero-shot learning techniques, as well as established data-sets, to identify previously unknown malware. Our approach achieves a remarkable performance of 83% accuracy, as well as high precision and recall, and represents a significant contribution to the field of cyber security.
Description: Full-text: https://doi.org/10.1109/ICECCME57830.2023.10252803
URI: https://repository.rsif-paset.org/xmlui/handle/123456789/323
Appears in Collections:ICTs including Big Data and Artificial Intelligence

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